Polarization characteristics of synchrotron radiation by means of rotating-analyzer ellipsometry using soft x-ray multilayer
- 15 February 1994
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 2010, 37-45
- https://doi.org/10.1117/12.168588
Abstract
We have measured the states of polarization of synchrotron radiation at a few beamlines at the Photon Factory using multilayer mirrors as a polarizer or an analyzer. Remarkable differences between the observed data and the theoretical prediction have been found for bending magnet radiation. It has been also found that changes of the states of polarization, especially the inclination of the major axis of the polarization ellipses is caused by the beamline optics both for bending and undulator radiation.Keywords
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