Further studies on thin film structures of metal-borosilicate glass-metal
- 1 August 1974
- journal article
- research article
- Published by Taylor & Francis in International Journal of Electronics
- Vol. 37 (2) , 145-156
- https://doi.org/10.1080/00207217408900509
Abstract
Further work on the electrical and electron emissive behaviour of metal-borosilicate glass-metal (MIM) structures is reported. Differences in behaviour of the samples are found for different electrode materials and a systematic variation of properties with insulator thickness is observed. By means of a technique of coating with SiO2 layers, the behaviour of samples containing more than 50% B2O3 can be studied. The variation of properties of M-I-M structures with temperature is discussed and related to the general problems of electronic conduction and emission.Keywords
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