Noise in junction- and MOS-FET's at high temperatures

• 30 November 1969
• journal article
• Published by Elsevier in Solid-State Electronics
• Vol. 12  (11) , 861-866
• https://doi.org/10.1016/0038-1101(69)90043-4

Abstract

Keywords

• MOS FET
• NOISE
• COURANT
• DRAIN
• SUBSTRAT
• LECKSTROM ZUR
• STEUERELECKTRODE EINES