X-ray photoelectron spectroscopy applied to insular films
- 1 January 1982
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 25 (1) , 67-73
- https://doi.org/10.1016/0368-2048(82)85005-6
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- XPS investigations of Cu(II) ion‐selective electrodesSurface and Interface Analysis, 1980
- Quantitative XPS analysis without reference samplesSurface and Interface Analysis, 1979
- Quantitative chemical analysis by ESCAJournal of Electron Spectroscopy and Related Phenomena, 1976