Statistical analysis of a two-ellipsoid overlap test for real-time failure detection
- 1 August 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Automatic Control
- Vol. 25 (4) , 762-773
- https://doi.org/10.1109/tac.1980.1102423
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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