Chemical surface reactions in the presence of high electric fields
- 1 April 1976
- journal article
- research article
- Published by Taylor & Francis in C R C Critical Reviews in Solid State Sciences
- Vol. 6 (2) , 133-156
- https://doi.org/10.1080/10408437608243552
Abstract
Since the invention of the field ion microscope (FIM) by E. W. Muller1 and the first mass-spectrometric analysis of field ions by Inghram and Gomer,2 these tools for field ionization have been developed considerably, as described in several monographs and summarizing artilces.3–8 Field ion mass spectrometry (FIMS) can analyze solid surfaces with extreme sensitivity. The experimental facilities enable ultimately the identification of single surface particles, which can be correlated to individual surface sites within the atomic scale of a surface. The atom-probe, which was developed by E. W. Müller,9 can now analyze surface particles with high precision in mass resolution.Keywords
This publication has 42 references indexed in Scilit:
- The imaging process in field ion microscopy from the fem to the atom‐probeC R C Critical Reviews in Solid State Sciences, 1976
- The effect of applied electric fields on chemisorptionSurface Science, 1975
- The thermal desorption of oxygen from silver after adsorption from 25 to 150 $deg;CJournal of Catalysis, 1974
- Field Adsorption of Inert-Gas Atoms on Field Ion Emitter SurfacesPhysical Review Letters, 1970
- Die Messung von Adsorptionswärmen an Einkristallflächen mit dem FeldelektronenmikroskopAngewandte Chemie, 1967
- Field-Induced Quantum States at a SurfaceThe Journal of Chemical Physics, 1966
- Das elektrische Massenfilter als Massenspektrometer und IsotopentrennerZeitschrift für Physik, 1958
- Field DesorptionPhysical Review B, 1956
- Das FeldionenmikroskopThe European Physical Journal A, 1951
- Deviations from Ohm's Law in Weak ElectrolytesThe Journal of Chemical Physics, 1934