Least-squares analysis of x-ray diffraction line shapes with analytic functions
- 1 February 1981
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 52 (2) , 748-754
- https://doi.org/10.1063/1.328757
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Affect of annealing on uniform and nonuniform strains in a sputtered Mo film on SiJournal of Applied Physics, 1979
- Simplifications in the x-ray line-shape analysisJournal of Applied Physics, 1979
- X-ray studies of deformed metalsProgress in Metal Physics, 1959