Implanted cardiac pacemakers: Experience with electronic testing

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Abstract
Seventy patients with implanted cardiac pacemakers have been followed in a special pacemaker clinic for periods up to five years. A system of electronic testing has been used after implanting 142 generators. Analysis of the stimulus artefact made it possible to predict generator failure in the majority of systems. In those pacemakers where the failure could be predicted, the fault was always associated with the battery supply. It was not possible to predict sudden electronic component failure. In order to use the generator's full resources and minimize unexpected battery failure, regular electronic testing is recommended.

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