In-Situ X-ray Scattering Study of Continuous Silica−Surfactant Self-Assembly during Steady-State Dip Coating
- 12 July 2003
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 107 (31) , 7683-7688
- https://doi.org/10.1021/jp027214i
Abstract
No abstract availableKeywords
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