Measurement of synchrotron x-ray energies and line shapes using diffraction markers
- 1 May 1982
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 53 (5) , 575-581
- https://doi.org/10.1063/1.1137026
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Conduction band symmetry in Ta chalcogenides from Ta L edge X-ray absorption spectroscopy (XAS)Journal of Physics C: Solid State Physics, 1981
- Species present in metal-ammonia near the metal-insulator transitionThe Journal of Physical Chemistry, 1980
- In situ intercalation of TaS2 in the electron microscopePhilosophical Magazine Part B, 1978
- The covalent bond in siliconProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1967