Thin film Al2O3:TiO2 composite dielectric
- 1 March 1984
- journal article
- research article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 13 (2) , 273-279
- https://doi.org/10.1007/bf02656680
Abstract
No abstract availableKeywords
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- Refractive-index-adjustable SiO2-Ta2O5 films for integrated optical circuitsApplied Physics Letters, 1978
- Electrical Properties of Mixed Oxide Film of PbO and TiO2Japanese Journal of Applied Physics, 1968
- The permittivity of two phase mixturesBritish Journal of Applied Physics, 1955