Multichannel Semiconductor Detectors for X-Ray Transmission Computed Tomography
- 1 January 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 27 (1) , 252-257
- https://doi.org/10.1109/tns.1980.4330835
Abstract
Multichannel semiconductor detectors for X-ray transmission computed tomography (XCT) have been developed using surface-barrier diodes fabricated from high-purity n-type silicon. X-rays are detected directly by the semiconductor detectors in the operational mode, non-biasing in conjunction with current to voltage converters (I/V converters). In addition to the image reconstruction test, the fundamental properties of the detector have been studied theoretically as well as experimentally.Keywords
This publication has 1 reference indexed in Scilit:
- PHOTON CROSS SECTIONS FROM 0.001 TO 100 MeV FOR ELEMENTS 1 THROUGH 100.Published by Office of Scientific and Technical Information (OSTI) ,1967