A channelplate image intensifier for the electron microscope

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Abstract
Electron beam damage is the most serious difficulty which restricts the use of the electron microscope for diffraction contrast investigations of crystalline polymers. As has been previously suggested by Brandon, Shectman and Seidman a channelplate image intensifier could be applied in studying damage sensitive specimens. In this note the gain characteristics of a Bendix Channeltron image intensifier are presented for various input current densities and electron energies. It is then shown that with this device it is possible under certain conditions to examine crystalline polymers in much the same fashion as nondamage sensitive materials.