Coverage measurements of the Si(100)2 × 1:Cs and Si(100)2 × 1:K surfaces: resolution of structural models
Open Access
- 2 February 1991
- journal article
- Published by Elsevier in Surface Science
- Vol. 243 (1-3) , L37-L40
- https://doi.org/10.1016/0039-6028(91)90330-u
Abstract
No abstract availableKeywords
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