Kinetics of Tantalum Corrosion in Aqueous Electrolytes, I

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Abstract
The spontaneous growth of thin (6–20Aå) oxide films on tantalum immersed into aqueous solutions of , , and has been investigated by means of capacitance and voltage measurements. There is a rather rapid initial oxide growth rate in until a thickness of about 12Aå is reached. Beyond that thickness and over the entire thickness range in the other electrolytes, the oxide thickness increases roughly in proportion to the logarithm of time. There is a small, but well established dependence of “oxide capacitance” on the pH of the electrolyte in which it is measured and a rather large, reversible temperature dependence of the oxide capacitance, which indicate that these thin oxide films do not behave as an ordinary dielectric.

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