Niobium trilayer Josephson tunnel junctions with ultrahigh critical current densities
- 6 September 1993
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 63 (10) , 1423-1425
- https://doi.org/10.1063/1.109697
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Degradation of superconducting tunnel junction characteristics with increasing barrier transparencyApplied Physics Letters, 1993
- Sub-μm, planarized, Nb-AlOx-Nb Josephson process for 125 mm wafers developed in partnership with Si technologyApplied Physics Letters, 1991
- Nb/AlOx/Nb trilayer process for the fabrication of submicron Josephson junctions and low-noise dc SQUIDsApplied Physics Letters, 1991
- Design considerations for DC SQUIDs fabricated in deep sub-micron technologyIEEE Transactions on Magnetics, 1991
- Refractory submillimeter Josephson effect sourcesIEEE Transactions on Magnetics, 1991
- Superconducting tunneling without the tunneling Hamiltonian. II. Subgap harmonic structureJournal of Low Temperature Physics, 1987
- Superconducting tunneling without the tunneling HamiltonianJournal of Low Temperature Physics, 1985
- Preparation and characteristics of Nb/Al-oxide-Nb tunnel junctionsJournal of Applied Physics, 1985
- Tunneling Between SuperconductorsPhysical Review Letters, 1963
- Tunneling Between SuperconductorsPhysical Review Letters, 1963