Fractal characterization by frequency analysis. II. A new method
- 1 December 1993
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 172 (3) , 233-238
- https://doi.org/10.1111/j.1365-2818.1993.tb03417.x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Fractal characterization by frequency analysis. I. SurfacesJournal of Microscopy, 1993
- Algorithms for random fractalsPublished by Springer Nature ,1988
- Fractals in nature: From characterization to simulationPublished by Springer Nature ,1988
- Random Fractal ForgeriesPublished by Springer Nature ,1985
- The Fractal Geometry of NatureAmerican Journal of Physics, 1983