Noise in STM due to atoms moving in the tunneling space
- 15 December 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 48 (23) , 17493-17506
- https://doi.org/10.1103/physrevb.48.17493
Abstract
A theory of electron tunneling through an adiabatically time-dependent potential barrier is applied to describe fluctuations of the scanning-tunneling-microscope current, induced by the motion of atoms in the tunneling gap. We show that atoms of a gas intervening between the tip and the sample introduce a noise small compared to the shot and thermal-electron noises. On the contrary, the noise induced by the movement of adsorbed atoms can be large enough to be observed. Simple formulas for the average current and temporal correlation functions of the current are offered to treat data on surface diffusion.Keywords
This publication has 13 references indexed in Scilit:
- Scanning-tunneling-microscopy study of the surface diffusion of sulfur on Re(0001)Physical Review B, 1993
- Scattering theory of current and intensity noise correlations in conductors and wave guidesPhysical Review B, 1992
- Equilibrium and shot noise in mesoscopic systemsPhysica B: Condensed Matter, 1991
- Theoretical aspects and experimental results of STM studies in polar liquidsJournal of Physics: Condensed Matter, 1991
- Scattering theory of thermal and excess noise in open conductorsPhysical Review Letters, 1990
- Thermal noise in vacuum scanning tunneling microscopy at zero bias voltageJournal of Vacuum Science & Technology A, 1990
- What is measured when you measure a resistance?—The Landauer formula revisitedIBM Journal of Research and Development, 1988
- Surface diffusion of oxygen atoms individually observed by STMSurface Science, 1986
- Generalized many-channel conductance formula with application to small ringsPhysical Review B, 1985
- Traversal Time for TunnelingPhysical Review Letters, 1982