THE DENSITY OF STATES IN METAL-SEMICONDUCTOR TUNNELING
- 1 July 1967
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 11 (1) , 29-31
- https://doi.org/10.1063/1.1754947
Abstract
A new method is suggested for analyzing the tunneling data from metal‐semiconductor (Schottky) junctions, and the method is appled to p‐type GaAs. The method allows a determination of the argument of the tunneling integral. The results indicate that the tunneling current depends upon the density of states of the semiconductor. This disagrees with Harrison's WKBJ results, but does agree with the recent exact solution of tunneling in Schottky junctions.Keywords
This publication has 7 references indexed in Scilit:
- Electron Tunneling in Metal-Semiconductor BarriersPhysical Review B, 1966
- Experimental Energy-Momentum Relationship Determination Using Schottky BarriersPhysical Review Letters, 1966
- Fermi Level Position at Metal-Semiconductor InterfacesPhysical Review B, 1964
- Band Structure Parameters Deduced from Tunneling ExperimentsJournal of Applied Physics, 1961
- Tunneling from an Independent-Particle Point of ViewPhysical Review B, 1961
- Antiferromagnetic Behaviour of GdB6Proceedings of the Physical Society, 1961
- Band structure of indium antimonideJournal of Physics and Chemistry of Solids, 1957