Electron-Temperature Dependence of Electron-Ion Recombination in Argon
- 5 December 1968
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 176 (1) , 322-326
- https://doi.org/10.1103/physrev.176.322
Abstract
A 3-mode microwave apparatus is used to study the dependence of the dissociative recombination coefficient on electron temperature over the range while the ion and gas temperatures remain at 300°K. A high- cavity mode is used to ionize the gas periodically, a second high- mode is used to determine the decay of electron density during the afterglow from the change of resonant frequency of the cavity, and a nonresonant waveguide mode is used to apply a constant microwave heating field to the electrons. At K, a value /sec is obtained from analysis of recombination-controlled electron-density decays using a computer solution of the electron continuity equation which includes recombination and ambipolar diffusion terms. Over the range , the coefficient is found to follow a simple variation. This result is reconciled with Fox and Hobson's variation, obtained under conditions where , on the basis of their changing vibrational-state populations with changing temperature. Finally, it is noted that our variation may be evidence for appreciable electron capture via the indirect as well as the direct dissociative process.
Keywords
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