Lifetime measurements of VUV emitting levels in He, Ne, Ar and CO using the inelastic electron-photon delayed coincidence technique
- 14 August 1984
- journal article
- Published by IOP Publishing in Journal of Physics B: Atomic and Molecular Physics
- Vol. 17 (15) , 3173-3182
- https://doi.org/10.1088/0022-3700/17/15/028
Abstract
The electron-photon delayed coincidence technique has been used to measure the lifetimes of excited states in He, Ne, Ar and CO that decay with the emission of VUV photons. The states with their measured lifetimes are: He, 51P 7.4+or-0.4 ns, 61P 14.0+or-0.3 ns, 71P 21.6+or-1.2 ns; Ne, 3s(3/2)1 20.5+or-0.7 ns; Ar, 4s(3/2)1 7.9+or-0.6 ns; CO,C 1 Sigma +v=0<or=1.5+or-0.3 ns.Keywords
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