Determination of changes in optical thickness of evaporated layers from peak shifts of multilayer Fabry-Perot interference filters
- 1 November 1972
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 13 (2) , 299-302
- https://doi.org/10.1016/0040-6090(72)90299-4
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Correlation between film structure and sorption behaviour of vapour deposited ZnS, cryolite and MgF2 filmsThin Solid Films, 1972
- Influence of Substrate Temperature on the Condensation of Vacuum Evaporated Films of MgF2 and ZnSJournal of Vacuum Science and Technology, 1969
- Porosity of MgF2 Films—Evaluation Based on Changes in Refractive Index Due to Adsorption of VaporsJournal of Vacuum Science and Technology, 1969
- Effect of thermal treatment on the characteristics of interference Fabry-Perot filtersThin Solid Films, 1969
- Dispersion of Zinc Sulfide and Magnesium Fluoride Films in the Visible SpectrumJournal of the Optical Society of America, 1955