4H-SiC Power Devices: Comparative Overview of UMOS, DMOS, and GTO Device Structures
- 1 January 1997
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Temperature dependence of Fowler-Nordheim current in 6H- and 4H-SiC MOS capacitorsIEEE Electron Device Letters, 1997
- 1.1 kV 4H-SiC power UMOSFETsIEEE Electron Device Letters, 1997
- 700-V asymmetrical 4H-SiC gate turn-off thyristors (GTO's)IEEE Electron Device Letters, 1997
- Analysis of polarization anisotropy along the c axis in the photoluminescence of wurtzite GaNApplied Physics Letters, 1997
- High-voltage double-implanted power MOSFET's in 6H-SiCIEEE Electron Device Letters, 1997