Probing of near surface semiconductor layers by electron energy loss spectroscopy
- 1 January 1990
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 54-55, 1163-1172
- https://doi.org/10.1016/0368-2048(90)80306-u
Abstract
No abstract availableKeywords
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