In-plane optical anisotropy of GaAs/AlAs multiple quantum wells probed by microscopic reflectance difference spectroscopy
- 5 August 1996
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 69 (6) , 782-784
- https://doi.org/10.1063/1.117890
Abstract
We present a technique, microscopic reflectance difference spectroscopy (μRDS), for the measurement of optical anisotropy with sub‐micron resolution. The technique is applied to the determination of the in‐plane anisotropy of GaAs/AlAs multiple quantum well structures in a phase resolved way, both below and above the fundamental gap. Confinement and local field effects are discussed, and a comparison is made with microscopic calculations based on a tight‐binding Hamiltonian for the electronic states.Keywords
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