An experimental approach to analog fault models
- 9 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 13.6/1-13.6/4
- https://doi.org/10.1109/cicc.1991.164061
Abstract
A comprehensive approach to model faults in analog circuits and systems based on experimental statistics of manufacturing defects is presented. A case study based on a simple sample-and-hold circuit is discussed with specific results. It is shown that the digital fault models are applicable to analog and mixed-signal circuits but they account only for catastrophic faults. Out-of-specification faults occur as often as catastrophic faults and must be addressed in any DFT (discrete Fourier transform) technique or test generation algorithm.Keywords
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