Silicon lattice constant: limits in IMGC X-ray/optical interferometry
- 1 April 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 40 (2) , 98-102
- https://doi.org/10.1109/TIM.1990.1032891
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Progress at IMGC in the absolute determination of the silicon dIEEE Transactions on Instrumentation and Measurement, 1989
- Experiment on the absolute measurement of a silicon lattice spacing at the NRLMIEEE Transactions on Instrumentation and Measurement, 1989
- Lattice bending in x-ray interferometersZeitschrift für Physik B Condensed Matter, 1989
- Diffraction Effects in Optical Interferometers Illuminated by Laser SourcesMetrologia, 1989
- Lattice distortions induced by carbon in siliconPhilosophical Magazine A, 1988
- The lattice parameter of highly pure silicon single crystalsZeitschrift für Physik B Condensed Matter, 1982
- Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon CrystalPhysical Review Letters, 1981
- X-ray and neutron interferometryPublished by Springer Nature ,1977
- Theory of a symmetric LLL interferometer with arbitrary absorptionPhysica Status Solidi (a), 1976
- X-Ray to Visible Wavelength RatiosPhysical Review Letters, 1973