Polarization-modulated attenuated total-internal reflection infrared spectroscopic study of surfaces: An application to the aging of oxide films on silicon plates
- 1 March 1983
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry
- Vol. 87 (5) , 730-731
- https://doi.org/10.1021/j100228a006