On the use of wide-angle energy-sensitive detectors in white-beam X-ray single-crystal diffraction
- 1 December 1980
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 178 (1) , 131-135
- https://doi.org/10.1016/0029-554x(80)90867-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A real-time back-reflection Laue cameraJournal of Applied Crystallography, 1979
- X-ray energy-dispersive diffractometry using synchrotron radiationJournal of Applied Crystallography, 1977
- Relations between integrated intensities in crystal diffraction methods for X-rays and neutronsActa Crystallographica Section A, 1975