Thickness dependence of the electrical and structural properties of In2O3:Sn films
- 1 July 1984
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 117 (2) , 95-100
- https://doi.org/10.1016/0040-6090(84)90081-6
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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