The effect of X-ray penetration depth on structural characterization of multiphase Bi-Sr-Ca-Cu-O thin films by X-ray diffraction techniques
- 1 February 1991
- journal article
- Published by Elsevier in Physica C: Superconductivity and its Applications
- Vol. 173 (3-4) , 152-158
- https://doi.org/10.1016/0921-4534(91)90362-3
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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