Single event effect proton and heavy ion test results for candidate spacecraft electronics

24 August 2005

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 64-71
https://doi.org/10.1109/redw.1994.633037

Abstract

We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. Device types include digital and analog components, MIL-STD-1553B transceivers, ADCs, FPGAs, SRAMs, optoelectronics, and a microprocessor.

Keywords

ELECTRONIC EQUIPMENT TESTING
PROTONS
SPACE VEHICLES
AEROSPACE ELECTRONICS
TEST FACILITIES
BICMOS INTEGRATED CIRCUITS
DIODES
SPACE TECHNOLOGY
SINGLE EVENT UPSET
CLOCKS

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