A Wave Approach to the Noise Properties of Linear Microwave Devices
- 1 January 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 26 (1) , 34-37
- https://doi.org/10.1109/tmtt.1978.1129303
Abstract
Noise temperature or noise factor are important parameters for many microwave devices. Their dependence on source characteristics is classically established using low-frequency concepts such as impedance, admittance, voltage, and current sources. This paper presents a derivation of the noise properties of linear two-ports in terms of noise waves, which leads to a convenient measurement method in distributed systems. Copyright © 1978 by The Institute of Electrical and Electronics Engineers, Inc.SCOPUS: ar.jinfo:eu-repo/semantics/publisheKeywords
This publication has 2 references indexed in Scilit:
- The determination of device noise parametersProceedings of the IEEE, 1969
- Theory of Noisy FourpolesProceedings of the IRE, 1956