Laser diodes for length determination using swept-frequency interferometry
- 1 September 1993
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 4 (9) , 988-994
- https://doi.org/10.1088/0957-0233/4/9/012
Abstract
A 780 nm diode laser swept-frequency heterodyne facility is described and its use demonstrated for accurate determination of the optical path length of two stable Fabry-Perot etalons. A frequency sweep of about 4 GHz is accurately determined by heterodyning against a fixed frequency stabilized reference laser. A measurement accuracy of 5*10-6 is demonstrated with one etalon by comparison with results from an independent multi-wavelength determination of the length. A standard error of the mean (1 sigma ) of a few parts per million or better is achieved. Ultimately, a 1 sigma length uncertainty of about 1.5*10-10 should be possible on stable optical structures by using frequency scans of ten to a hundred times the present range, in conjunction with a fixed frequency reference at 780 nm.Keywords
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