Optical Thickness Monitor for Thin Film Deposition
- 1 April 1975
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 14 (4) , 962-969
- https://doi.org/10.1364/ao.14.000962
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 7 references indexed in Scilit:
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- Optical Film Thickness MonitoringReview of Scientific Instruments, 1971
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- Some Methods for Measurements on Thin FilmsOptica Acta: International Journal of Optics, 1958
- La détermination de l'indice et de l'épaisseur des couches minces transparentesJournal de Physique et le Radium, 1950