Detector discrimination in SIMS: Ion-to-electron converter yield factors for positive ions
- 31 July 1978
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 27 (3) , 249-261
- https://doi.org/10.1016/0020-7381(78)80112-0
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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