Graphical Method for Estimation of Contrast in Electron Microscopy
- 1 August 1958
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 29 (8) , 1235-1237
- https://doi.org/10.1063/1.1723409
Abstract
In the preparation of shadowed specimens for electron microscopic examination, it is often required to estimate the contrast to be expected with different thicknesses of films of various metals, different aperture angles, and beam potentials. This communication describes a graphical method for this purpose.This publication has 2 references indexed in Scilit:
- Experimental Study of Electron Scattering in Electron Microscope SpecimensJournal of Applied Physics, 1957
- Scattering Phenomena in Electron Microscope Image FormationJournal of Applied Physics, 1951