XPS analysis of sol‐gel processed doped and undoped TiO2 films for sensors
- 1 July 1994
- journal article
- sensors
- Published by Wiley in Surface and Interface Analysis
- Vol. 22 (1-12) , 376-379
- https://doi.org/10.1002/sia.740220182
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- X-ray photoelectron study of surface layers on orthopaedic alloys. I. Ti–6Al–4V (ASTM F-136) alloyJournal of Vacuum Science & Technology A, 1993
- Humidity-Sensitive Properties of Titania Films Prepared Using the Sol-Gel ProcessJournal of the Ceramic Society of Japan, 1993
- Reversible carbon monoxide addition to sol-gel derived composite films containing a cationic rhodium(I) complex: towards the development of a new class of molecule-based carbon monoxide sensorsChemistry of Materials, 1992
- Electrical Properties of TiO2‐K2Ti6O13 Porous Ceramic Humidity SensorJournal of the American Ceramic Society, 1990
- Surface defects of TiO2(110): A combined XPS, XAES AND ELS studySurface Science, 1984
- Auger electron spectroscopy of TiO2: Inter-and intra-atomic transitions connected with the valence bandSurface Science, 1983
- X-ray photoelectron spectroscopy (XPS) studies of clean and hydrated TiO2 (rutile) surfacesChemical Physics Letters, 1979
- Two-dimensional chemical state plots: a standardized data set for use in identifying chemical states by x-ray photoelectron spectroscopyAnalytical Chemistry, 1979
- Chemical shifts of Auger lines, and the Auger parameterFaraday Discussions of the Chemical Society, 1975
- Auger lines in x-ray photoelectron spectrometryAnalytical Chemistry, 1972