Radiation Effects in a Virtual Phase CCD Imager

1 December 1981

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 28 (6) , 4027-4032
https://doi.org/10.1109/tns.1981.4335668

Abstract

CCD imagers fabricated using a single gate process have been subjected to total dose γ-ray exposures of 1 megarad. The devices are operational after the test. The effect of the radiation on the performance is discussed.

Keywords

RADIATION EFFECTS
CHARGE COUPLED DEVICES
CLOCKS
INSTRUMENTS
TESTING
SPACE TECHNOLOGY
PIXEL
IONIZING RADIATION
LIGHTING
LABORATORIES

This publication has 2 references indexed in Scilit:

Virtual phase CCD technology
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1979
Process Optimization of Radiation-Hardened CMOS Integrated Circuits
IEEE Transactions on Nuclear Science, 1975