The migrational characteristics of the cusp-oriented α/κ interface in the Cu-Si system
- 1 April 1971
- journal article
- transpotr phenomena
- Published by Springer Nature in Metallurgical Transactions
- Vol. 2 (4) , 1193-1202
- https://doi.org/10.1007/bf02664252
Abstract
No abstract availableKeywords
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