Contact-pad design for high-frequency silicon measurements
- 11 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- A multiline method of network analyzer calibrationIEEE Transactions on Microwave Theory and Techniques, 1991
- Characteristic impedance determination using propagation constant measurementIEEE Microwave and Guided Wave Letters, 1991