Temperature Dependence of the Static Dielectric Constant of a Symmetry-Induced Zero-Gap Semiconductor
- 14 December 1970
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 25 (24) , 1658-1660
- https://doi.org/10.1103/physrevlett.25.1658
Abstract
It is shown that the random-phase approximation static dielectric constant of a semiconductor with a conduction—valence-band degeneracy is nondivergent at zero momentum transfer for any concentration of ionized impurities (including the intrinsic material) so long as . The temperature dependence of the dielectric constant is calculated. It is shown that in the nondegenerate limit the dependence of the interband polarization is pure . Illustrative calculations are presented for .
Keywords
This publication has 11 references indexed in Scilit:
- Evidence for a Dielectric Singularity in HgSe and HgTePhysical Review B, 1970
- Ionized-Impurity-Limited Mobility of-Sn in the Random-Phase ApproximationPhysical Review B, 1970
- Anomalous Mobility and Dielectric Singularity of-SnPhysical Review Letters, 1970
- Dielectric Constant and Mobility of a Doped Zero-Gap SemiconductorPhysical Review Letters, 1969
- Ionized-Impurity-Limited Mobility and the Band Structure of Mercuric SelenidePhysical Review B, 1969
- Frequency-Dependent Dielectric Function of a Zero-Gap SemiconductorPhysical Review Letters, 1968
- Anisotropy of the Gray-TinConduction BandPhysical Review B, 1968
- Static Dielectric Function of a Zero-Gap SemiconductorPhysical Review Letters, 1968
- A dielectric formulation of the many body problem: Application to the free electron gasIl Nuovo Cimento (1869-1876), 1958
- The computation of Fermi-Dirac functionsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1938