Stable Growth and Kinetic Roughening in Electrochemical Deposition
- 20 June 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 72 (25) , 4025-4028
- https://doi.org/10.1103/physrevlett.72.4025
Abstract
We studied kinetic roughening of copper which was electrodeposited at slow rates. The surfaces showed a unique scaling. In the shorter length regime, the interface width scaled with the length scale as (). In the longer length regime, the width scaled with the deposition time as (). The value of , 2.8, is much larger than 2 predicted for the case where the growing direction is normal to the surface everywhere. The scaling behavior is interpreted as the result of enhanced growth of the protrusions owing to nonlocal Laplacian growth effect.
Keywords
This publication has 15 references indexed in Scilit:
- Self-affine growth of copper electrodepositsPhysical Review B, 1993
- Columnar growth and kinetic roughening in electrochemical depositionPhysical Review Letters, 1992
- Microstructure and surface scaling in ballistic deposition at oblique incidencePhysical Review A, 1989
- Roughness Development in Metal Electrodeposition: I . Experimental ResultsJournal of the Electrochemical Society, 1989
- Laplace- and diffusion-field-controlled growth in electrochemical depositionPhysical Review Letters, 1989
- Ballistic deposition on surfacesPhysical Review A, 1986
- Dendritic and Fractal Patterns in Electrolytic Metal DepositsPhysical Review Letters, 1986
- Dynamic Scaling of Growing InterfacesPhysical Review Letters, 1986
- Stability of a Planar Interface During Solidification of a Dilute Binary AlloyJournal of Applied Physics, 1964
- Morphological Stability of a Particle Growing by Diffusion or Heat FlowJournal of Applied Physics, 1963