Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces
- 1 April 2000
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 157 (4) , 263-268
- https://doi.org/10.1016/s0169-4332(99)00537-1
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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