Some aspects of the structure-properties relationships associated with haze in SOS
- 1 June 1982
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 58 (1) , 44-52
- https://doi.org/10.1016/0022-0248(82)90208-1
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Measurement of the near-surface crystallinity of silicon on sapphire by UV reflectanceJournal of Crystal Growth, 1982
- The characterization of heteroepitaxial siliconJournal of Crystal Growth, 1982
- Cross-sectional electron microscopy of silicon on sapphireApplied Physics Letters, 1975