Determination of Phase Transformation Depth Profiles with Synchrotron Radiation
- 1 April 1987
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 70 (4) , 227-231
- https://doi.org/10.1111/j.1151-2916.1987.tb04972.x
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Calibration Curve for Quantitative Analysis of the Monoclinic-Tetragonal ZrO2System by X-Ray DiffractionJournal of the American Ceramic Society, 1984
- Mechanics of Transformation‐Toughening in Brittle MaterialsJournal of the American Ceramic Society, 1982
- Transformation tougheningJournal of Materials Science, 1982
- X‐Ray Determination of Transformation Depths in Ceramics Containing Tetragonal ZrO2Journal of the American Ceramic Society, 1981
- ANALYTICAL APPROXIMATIONS FOR X-RAY CROSS SECTIONS. [PART] II.Published by Office of Scientific and Technical Information (OSTI) ,1971
- The crystal structure of tetragonal ZrO2Acta Crystallographica, 1962