Large-scale simulation studies in image pattern recognition
- 1 January 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 19 (10) , 1067-1079
- https://doi.org/10.1109/34.625107
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Document image defect models and their usesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Perfect metricsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Pattern Classification with Compact Distribution MapsComputer Vision and Image Understanding, 1998
- Document Image Defect ModelsPublished by Springer Nature ,1992
- Bias of Nearest Neighbor Error EstimatesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1987
- Recent advances in error rate estimationPattern Recognition Letters, 1986
- Bibliography on estimation of misclassificationIEEE Transactions on Information Theory, 1974
- Nearest neighbor pattern classificationIEEE Transactions on Information Theory, 1967