AlGaN/InGaN/GaN blue light emitting diode degradation under pulsed current stress

• 12 August 1996
• journal article
• Published by AIP Publishing in Applied Physics Letters
• Vol. 69  (7) , 898-900
• https://doi.org/10.1063/1.116936

Abstract

Keywords

• ELECTRIC CONDUCTIVITY
• LIGHT EMITTING DIODE