A novel method for the experimental determination of the coupling ratios in submicron EPROM and flash EEPROM cells

Publisher Website

4 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iedm.1990.237217

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

Characterization and suppression of drain coupling in submicrometer EPROM cells
IEEE Transactions on Electron Devices, 1987
Analysis and modeling of floating-gate EEPROM cells
IEEE Transactions on Electron Devices, 1986
Hot-electron injection into the oxide in n-channel MOS devices
IEEE Transactions on Electron Devices, 1981