Identification and Annealing of Common Intrinsic Defect Centers

• 15 September 2003
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 433-436, 471-476
• https://doi.org/10.4028/www.scientific.net/msf.433-436.471

Abstract

Keywords

• ANNEALING MECHANISM
• ANTISITE
• HYPERFINE PARAMETER
• VACANCY